Secondary Ion Mass Spectrometry SIMS V: Proceedings of the...

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Secondary Ion Mass Spectrometry SIMS V:...

Secondary Ion Mass Spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

R. E. Honig (auth.), Professor Dr. Alfred Benninghoven, Dr. Richard J. Colton, Dr. David S. Simons, Dr. Helmut W. Werner (eds.)

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Kategorie:

Rok:

1986

Wydanie:

1

Wydawnictwo:

Springer-Verlag Berlin Heidelberg

Język:

english

Strony:

564

ISBN 10:

3642827268

ISBN 13:

9783642827266

Serie:

Springer Series in Chemical Physics 44

Plik:

PDF, 14.85 MB

IPFS:

,

english, 1986

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